Data Fields
rllatentFault_t Struct Reference

mmwave radar device latent fault test More...

#include <control/mmwavelink/include/rl_device.h>

Data Fields

rlUInt32_t testEn1
 Bits Definition
0 MibSPI self-test
1 DMA self-test
2 RESERVED
3 RTI self-test
4 ESM self-test
5 EDMA self-test
6 CRC self-test
7 VIM self-test
8 RESERVED
9 Mailbox self-test
10 LVDS pattern generation test
11 CSI2 pattern generation test
12 Generating NERROR
13 MibSPI single bit error test
14 MibSPI double bit error test
15 DMA Parity error
16 TCMA RAM single bit errors
17 TCMB RAM single bit errors
18 TCMA RAM double bit errors
19 TCMB RAM double bit errors
20 TCMA RAM parity errors.
21 TCMB RAM parity errors.
22 RESERVED
23 RESERVED
24 DMA MPU Region tests
25 MSS Mailbox Single bit errors
26 MSS Mailbox double bit errors
27 radarSS Mailbox Single bit errors
28 radarSS Mailbox double bit errors
29 EDMA MPU test
30 EDMA parity test
31 CSI2 parity test
.
 
rlUInt32_t testEn2
 Bits Definition
0 DCC self test
1 DCC fault insertion
2 PCR fault generation test
3 VIM RAM parity test
4 SCI boot time test
31:5 RESERVED
.
 
rlUInt8_t repMode
 Value Definition
0 Report is sent after test completion
1 Report is send only upon a failure
.
 
rlUInt8_t testMode
 Value Definition
0 Production mode. Latent faults are tested and any failures are reported
1 Characterization mode. Faults are injected and failures are reported which
allows testing of the failure reporting
.
 
rlUInt16_t reserved
 Reserved for future use.
 

Detailed Description

mmwave radar device latent fault test

Definition at line 319 of file rl_device.h.

The documentation for this struct was generated from the following file:
Copyright 2018, Texas Instruments Incorporated