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mmwave radar test pattern config More...
#include <control/mmwavelink/include/rl_device.h>
Data Fields | |
| rlUInt8_t | testPatGenCtrl |
| This field controls the enable-disable of the generation of the test pattern. Value Description 0x0 Disable test pattern generation 0x1 Enable test pattern generation 0x2 Frame clock calibration mode - Enable test pattern generation . | |
| rlUInt8_t | testPatGenTime |
| Number of system clocks (200 MHz) between successive samples for the test pattern gen. Applicable only in case of Test pattern enable. Else ignored. . | |
| rlUInt16_t | testPatrnPktSize |
| Number of ADC samples to capture for each RX Valid range: 64 to MAX_NUM_SAMPLES, Where MAX_NUM_SAMPLES is such that all the enabled RX channels’ data fits into 16 kB memory, with each sample consuming 2 bytes for real ADC output case and 4 bytes for complex 1x and complex 2x ADC output cases. For example: 4 RX, Complex ADC output -> MAX_NUM_SAMPLES = 1024 4 RX, Real ADC output -> MAX_NUM_SAMPLES = 2048 2 RX, Complex ADC output -> MAX_NUM_SAMPLES = 2048 2 RX, Real ADC output -> MAX_NUM_SAMPLES = 4096. | |
| rlUInt32_t | numTestPtrnPkts |
| Number of test pattern packets to send, for infinite packets set it to 0. | |
| rlUInt32_t | testPatRx0Icfg |
| This field specifies the values for Rx0, I channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data . | |
| rlUInt32_t | testPatRx0Qcfg |
| This field specifies the values for Rx0, Q channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data . | |
| rlUInt32_t | testPatRx1Icfg |
| This field specifies the values for Rx1, I channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | testPatRx1Qcfg |
| This field specifies the values for Rx1, Q channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | testPatRx2Icfg |
| This field specifies the values for Rx2, I channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | testPatRx2Qcfg |
| This field specifies the values for Rx2, Q channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | testPatRx3Icfg |
| This field specifies the values for Rx3, I channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | testPatRx3Qcfg |
| This field specifies the values for Rx3, Q channel. Applicable only in case of test pattern enable. Else ignored. Bits Description [15:0] Start offset value to be used for the first sample for the test pattern data [31:16] Value to be added for each successive sample for the test pattern data. | |
| rlUInt32_t | reserved |
| Reserved for future use. | |
mmwave radar test pattern config
Definition at line 451 of file rl_device.h.